描述
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.配置
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEM 代工型號說明
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N & K
3700 RT
已驗證
類別
Thin Film / Film Thickness
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
12889
晶圓尺寸:
8"/200mm
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
N & K
3700 RT
類別
Thin Film / Film Thickness
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
12889
晶圓尺寸:
8"/200mm
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.配置
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEM 代工型號說明
未提供文檔
無文檔