描述
Provides precise, non-destructive thin film stress measurement via substrate curvature analysis, supporting process control, failure analysis, and R&D applications. Configured for wafer-based measurements with support for sizes up to approximately 200mm. Power: 115V / 1 Phase / 60Hz配置
無配置OEM 代工型號說明
未提供文檔
無文檔
KLA
FLX 2320A
類別
Thin Film / Film Thickness
上次驗證: 16 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
146114
晶圓尺寸:
8"/200mm
年份:
1993
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Provides precise, non-destructive thin film stress measurement via substrate curvature analysis, supporting process control, failure analysis, and R&D applications. Configured for wafer-based measurements with support for sizes up to approximately 200mm. Power: 115V / 1 Phase / 60Hz配置
無配置OEM 代工型號說明
未提供文檔
無文檔