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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA UV-1280SE
    描述
    FILM THICKNESS MEASUREMENT
    配置
    無配置
    OEM 代工型號說明
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    文檔

    無文檔

    KLA

    UV-1280SE

    verified-listing-icon

    已驗證

    類別
    Thin Film / Film Thickness

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    78325


    晶圓尺寸:

    8"/200mm


    年份:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness
    年份: 2000條件: 二手
    上次驗證超過60天前

    KLA

    UV-1280SE

    verified-listing-icon
    已驗證
    類別
    Thin Film / Film Thickness
    上次驗證: 超過60天前
    listing-photo-95de351d15fd48baae961fc817937efa-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    78325


    晶圓尺寸:

    8"/200mm


    年份:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    FILM THICKNESS MEASUREMENT
    配置
    無配置
    OEM 代工型號說明
    The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness年份: 2000條件: 二手上次驗證:超過60天前
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness年份: 0條件: 二手上次驗證:超過60天前
    KLA UV-1280SE

    KLA

    UV-1280SE

    Thin Film / Film Thickness年份: 2000條件: 二手上次驗證:超過60天前