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KLA UV-1250SE
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.
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    已驗證

    類別
    Thin Film / Film Thickness

    上次驗證: 13 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    147940


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    KLA UV-1250SE

    KLA

    UV-1250SE

    Thin Film / Film Thickness
    年份: 0條件: 二手
    上次驗證18 天前

    KLA

    UV-1250SE

    verified-listing-icon
    已驗證
    類別
    Thin Film / Film Thickness
    上次驗證: 13 天前
    listing-photo-a8065d781847422ea73304aa988f4890-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/a8065d781847422ea73304aa988f4890/e047a275d58a493186cacdc25039ff7e_whatsappimage20260606at08_mw.jpeg
    listing-photo-a8065d781847422ea73304aa988f4890-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/a8065d781847422ea73304aa988f4890/b26684604a8e47c1a08ee89a97ba3924_whatsappimage20260606at08_mw.jpeg
    listing-photo-a8065d781847422ea73304aa988f4890-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/a8065d781847422ea73304aa988f4890/d3272e7d734e4d51a03a5821a9027ef9_whatsappimage20260606at08_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    147940


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The Prometrix UV-1250SE Thin Film Measurement System is a tool that can measure film thickness, refractive index, extinction coefficient, and goodness-of-fit of single or multi-layer thin film stacks. It combines spectroscopic ellipsometry and broadband UV spectrophotometry for non-destructive optical characterization. This results in greater productivity and tighter process control.
    文檔

    無文檔

    類似上架商品
    查看全部
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    UV-1250SE

    Thin Film / Film Thickness年份: 0條件: 二手上次驗證:13 天前
    KLA UV-1250SE

    KLA

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    Thin Film / Film Thickness年份: 0條件: 二手上次驗證:超過60天前