描述
Thin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafers)配置
無配置OEM 代工型號說明
Same as 8300X. Spectroscopic ellipsometer. The 8300XSE includes a fully integrated spectroscopic ellipsometer which expands the measurement capabilities of the basic product, especially in ultrathin and multiple film stack measurement applications.文檔
無文檔
類別
Thin Film / Film Thickness
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
116017
晶圓尺寸:
6"/150mm, 8"/200mm, 12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300XSE
類別
Thin Film / Film Thickness
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
116017
晶圓尺寸:
6"/150mm, 8"/200mm, 12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Thin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafers)配置
無配置OEM 代工型號說明
Same as 8300X. Spectroscopic ellipsometer. The 8300XSE includes a fully integrated spectroscopic ellipsometer which expands the measurement capabilities of the basic product, especially in ultrathin and multiple film stack measurement applications.文檔
無文檔