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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8300X
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The NanoSpec 8300X is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It was first introduced in July 1996 at the SEMICON/West trade show and is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today. The development of the NanoSpec 8300X was part of a project launched by SEMATECH, a consortium of large U.S. semiconductor manufacturers, to develop tools for the eventual industry shift to the manufacture of ICs on 300mm semiconductor wafers, which are designed to allow lower production cost due to the ability to simultaneously manufacture many more chips per wafer.
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    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    verified-listing-icon

    已驗證

    類別
    Thin Film / Film Thickness

    上次驗證: 昨日

    關鍵商品詳情

    條件:

    Parts Tool


    作業狀態:

    未知


    產品編號:

    114479


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
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    Available
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    Available
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    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8300X

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    Thin Film / Film Thickness
    年份: 0條件: 零件工具
    上次驗證昨日

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    verified-listing-icon
    已驗證
    類別
    Thin Film / Film Thickness
    上次驗證: 昨日
    listing-photo-b4305681a53e48de82f769ba3791c70b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/b4305681a53e48de82f769ba3791c70b/d434c2a2bcd241668db37a889497b396_82613d6b2013440086d2af47e4ef3d15_mw.jpeg
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    listing-photo-b4305681a53e48de82f769ba3791c70b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/b4305681a53e48de82f769ba3791c70b/eb853999b47d4709a9ecd34f8ac08ee4_258e609015ba4b548c6bdc29b2e1836b_mw.jpeg
    listing-photo-b4305681a53e48de82f769ba3791c70b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/b4305681a53e48de82f769ba3791c70b/dbbb0f8f721e4f89839fbcb233efad0b_64a0a0edd9154aba9b5d752776df0ae4_mw.jpeg
    關鍵商品詳情

    條件:

    Parts Tool


    作業狀態:

    未知


    產品編號:

    114479


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The NanoSpec 8300X is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It was first introduced in July 1996 at the SEMICON/West trade show and is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today. The development of the NanoSpec 8300X was part of a project launched by SEMATECH, a consortium of large U.S. semiconductor manufacturers, to develop tools for the eventual industry shift to the manufacture of ICs on 300mm semiconductor wafers, which are designed to allow lower production cost due to the ability to simultaneously manufacture many more chips per wafer.
    文檔

    無文檔

    類似上架商品
    查看全部
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8300X

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    Thin Film / Film Thickness年份: 0條件: 零件工具上次驗證:昨日