描述
METROLOGY配置
8300 XSEOEM 代工型號說明
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.文檔
無文檔
類別
Thin Film / Film Thickness
上次驗證: 17 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
149426
晶圓尺寸:
8"/200mm, 12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8300
類別
Thin Film / Film Thickness
上次驗證: 17 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
149426
晶圓尺寸:
8"/200mm, 12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
METROLOGY配置
8300 XSEOEM 代工型號說明
The NanoSpec 8300 is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today.文檔
無文檔