描述
Critical Dimension (CD) Measurement (non SEM)配置
無配置OEM 代工型號說明
The Atlas III, Atlas II+, and Atlas XP/Atlas XP+ line of high-performance metrology systems providing optical critical dimension (“OCD”®), thin film metrology and wafer stress for transistor and interconnect metrology applications.文檔
無文檔
類別
Thin Film / Film Thickness
上次驗證: 19 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
147775
晶圓尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
ATLAS III
類別
Thin Film / Film Thickness
上次驗證: 19 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
147775
晶圓尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Critical Dimension (CD) Measurement (non SEM)配置
無配置OEM 代工型號說明
The Atlas III, Atlas II+, and Atlas XP/Atlas XP+ line of high-performance metrology systems providing optical critical dimension (“OCD”®), thin film metrology and wafer stress for transistor and interconnect metrology applications.文檔
無文檔