描述
FEI Tecnai G2 F30 TWIN 300kV FEG TEM配置
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM 代工型號說明
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TECNAI
F20
類別
TEM
上次驗證: 12 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
147194
晶圓尺寸:
未知
年份:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
FEI Tecnai G2 F30 TWIN 300kV FEG TEM配置
– FEI Tecnai G2 F30 TWIN 300 kV FEG Transmission Electron Microscope – Suitable for materials science, nanomaterials, and life sciences ** BEAM ** – Field emission gun (FEG) – Acceleration voltage: 300 kV ** RESOLUTION ** – Point resolution: 0.24 nm – Line resolution: 0.14 nm ** DETECTORS ** – Gatan UltraScan 4000 UHS MP (multi-port readout) for 300 kV ** STAGE ** – Single-tilt holder – Single-tilt tomography holder – Double-tilt holder – Five-axis motorized goniometer stage – Typical tilt range up to ±70 degrees with tomography holderOEM 代工型號說明
未提供文檔
無文檔