
描述
FEI Titan 80-300 transmission electron microscope (TEM/STEM) utilizes aberration correction technology at its core, integrating multi-mode observation and in-situ analysis capabilities.配置
High Voltage Ranger: - 80 kV to 300 kV Convergent Beam Voltage Ranger: - 80 kV, 200 kV, 300 kV TEM: - At 300 kV voltage, resolution reaches up to 0.20 nm STEM Resolution: - At 300 kV voltage: 0.136 nm Camera Pixels: - GATAN Digital Camera: 2k×2k pixels - GATAN OneView IS CMOS Camera: 4k×4k pixelsOEM 代工型號說明
未提供文檔
無文檔
類別
TEM
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151846
晶圓尺寸:
未知
年份:
2009
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FEI-TECNAI
Titan 80-300
類別
TEM
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151846
晶圓尺寸:
未知
年份:
2009
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
FEI Titan 80-300 transmission electron microscope (TEM/STEM) utilizes aberration correction technology at its core, integrating multi-mode observation and in-situ analysis capabilities.配置
High Voltage Ranger: - 80 kV to 300 kV Convergent Beam Voltage Ranger: - 80 kV, 200 kV, 300 kV TEM: - At 300 kV voltage, resolution reaches up to 0.20 nm STEM Resolution: - At 300 kV voltage: 0.136 nm Camera Pixels: - GATAN Digital Camera: 2k×2k pixels - GATAN OneView IS CMOS Camera: 4k×4k pixelsOEM 代工型號說明
未提供文檔
無文檔