
描述
Aberration-Corrected TEM Main Unit: FEI Titan G2 Cubed 60-300 Double spherical aberration-corrected ultra-high resolution transmission electron microscope can observe, characterize, and quantitatively analyze the microstructure, elemental composition, and chemical valence state of materials at the subatomic scale, and conduct in-situ dynamic experiments using a specially designed sample stage Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG) Microscope Column Main Workstation + LCD Monitor Control Panels (QTY 2) 300 kV High Voltage Box Power Control Cabinet配置
Bottom Mount Digital Camera: - Gatan 894 Camera (4M) - Controller & imaging software Microscope Alignment File (One free-of-charge alignment at 300 kV) STEM: - Fischione HAADF Detector and STEM Control Cabinet (Used/Old) - TIA Imaging Software Correctors: - Objective Lens Corrector (Image Corrector) Compressor: - Air Compressor - Water Tank / Chiller (Cooler) Vacuum System: - Mechanical Pump, Molecular Pump, Ion Pump Software & Control Systems: - Windows based operating system - Control Software: FEI TUI software platform, used to control all microscope functions, lenses, alignment, cameras, and accessories.OEM 代工型號說明
未提供文檔
無文檔
類別
TEM
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151783
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
TITAN Cubed G2 60-300
類別
TEM
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151783
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Aberration-Corrected TEM Main Unit: FEI Titan G2 Cubed 60-300 Double spherical aberration-corrected ultra-high resolution transmission electron microscope can observe, characterize, and quantitatively analyze the microstructure, elemental composition, and chemical valence state of materials at the subatomic scale, and conduct in-situ dynamic experiments using a specially designed sample stage Ultra-stable, high-brightness Schottky Field Emission Gun (X-FEG) Microscope Column Main Workstation + LCD Monitor Control Panels (QTY 2) 300 kV High Voltage Box Power Control Cabinet配置
Bottom Mount Digital Camera: - Gatan 894 Camera (4M) - Controller & imaging software Microscope Alignment File (One free-of-charge alignment at 300 kV) STEM: - Fischione HAADF Detector and STEM Control Cabinet (Used/Old) - TIA Imaging Software Correctors: - Objective Lens Corrector (Image Corrector) Compressor: - Air Compressor - Water Tank / Chiller (Cooler) Vacuum System: - Mechanical Pump, Molecular Pump, Ion Pump Software & Control Systems: - Windows based operating system - Control Software: FEI TUI software platform, used to control all microscope functions, lenses, alignment, cameras, and accessories.OEM 代工型號說明
未提供文檔
無文檔