
描述
a 200kV field emission transmission electron microscope that combines high-resolution imaging with powerful chemical composition analysis capabilities. Its compact structure and excellent stability make it a primary instrument for routine microscopic characterization and analysis of nanomaterials. Main Unit (The Core Instrument): FEI Tecnai F20 1 • Transmission Electron Microscope Main Unit: FEI Tecnai F20 • Schottky Field Emission Gun (FEG) • Host Workstation + LCD Monitor • Electron Gun & Column (System Column) • Control Operating Panels ($2\times$) • $200\text{ kV}$ High-Voltage Tank / Box • Power Control Cabinet 1 Bottom-Mount Digital Camera 2 • Gatan OneView Camera (with in-situ capabilities) • Controller and Imaging Software 1 Align Genie (Beam Alignment) 3 Microscope Alignment Files (One free-of-charge alignment at $200\text{ kV}$) 1 Energy-Dispersive X-ray Spectrometer (EDS) 4 Oxford Xplore 80 Detector ($80\text{ mm}^2$) 1 5 X4 Processor (Graphics & Pulse Processor) 1 Scanning Transmission Mode (STEM) 6 Fischione HAADF Detector and STEM Control Cabinet 1 7 TIA Imaging Software 1 Cooler / Compressor 8 Air Compressor 1 9 Water Chiller / Tank 1 Vacuum System 10 Mechanical Pump, Turbo Molecular Pump, Ion Getter Pump 1 Software and Control Systems 11 Operating System: Windows-based OS 1 12 Control Software: FEI TUI Software Platform (controls all microscope functions, lenses, alignments, cameras, and attachments)配置
Accelerating Voltage: 200 kV Electron Gun: Thermal Field Emission Source (Schottky FEG) Energy Resolution: < 0.7 eV Point Resolution: 0.24 nm Information Limit: 0.14 nm Line Resolution: 0.102 nm Magnification Range: 25x – 1,030,000xOEM 代工型號說明
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類別
TEM
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151896
晶圓尺寸:
未知
年份:
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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Tecnai T20
類別
TEM
上次驗證: 18 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
151896
晶圓尺寸:
未知
年份:
2005
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
a 200kV field emission transmission electron microscope that combines high-resolution imaging with powerful chemical composition analysis capabilities. Its compact structure and excellent stability make it a primary instrument for routine microscopic characterization and analysis of nanomaterials. Main Unit (The Core Instrument): FEI Tecnai F20 1 • Transmission Electron Microscope Main Unit: FEI Tecnai F20 • Schottky Field Emission Gun (FEG) • Host Workstation + LCD Monitor • Electron Gun & Column (System Column) • Control Operating Panels ($2\times$) • $200\text{ kV}$ High-Voltage Tank / Box • Power Control Cabinet 1 Bottom-Mount Digital Camera 2 • Gatan OneView Camera (with in-situ capabilities) • Controller and Imaging Software 1 Align Genie (Beam Alignment) 3 Microscope Alignment Files (One free-of-charge alignment at $200\text{ kV}$) 1 Energy-Dispersive X-ray Spectrometer (EDS) 4 Oxford Xplore 80 Detector ($80\text{ mm}^2$) 1 5 X4 Processor (Graphics & Pulse Processor) 1 Scanning Transmission Mode (STEM) 6 Fischione HAADF Detector and STEM Control Cabinet 1 7 TIA Imaging Software 1 Cooler / Compressor 8 Air Compressor 1 9 Water Chiller / Tank 1 Vacuum System 10 Mechanical Pump, Turbo Molecular Pump, Ion Getter Pump 1 Software and Control Systems 11 Operating System: Windows-based OS 1 12 Control Software: FEI TUI Software Platform (controls all microscope functions, lenses, alignments, cameras, and attachments)配置
Accelerating Voltage: 200 kV Electron Gun: Thermal Field Emission Source (Schottky FEG) Energy Resolution: < 0.7 eV Point Resolution: 0.24 nm Information Limit: 0.14 nm Line Resolution: 0.102 nm Magnification Range: 25x – 1,030,000xOEM 代工型號說明
未提供文檔
無文檔