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THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30
    描述
    This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or film in TEM. Capabilities: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images) Holders: Single-tilt holder Double-tilt holder Cryo-holder Tomography holder
    配置
    Specifications: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images)
    OEM 代工型號說明
    The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.
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    已驗證

    類別
    TEM

    上次驗證: 超過60天前

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    條件:

    Used


    作業狀態:

    未知


    產品編號:

    131555


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
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    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEM
    年份: 0條件: 二手
    上次驗證超過60天前

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    verified-listing-icon
    已驗證
    類別
    TEM
    上次驗證: 超過60天前
    listing-photo-bd740332eada49ccb6ecd0a20f64b795-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/87744/bd740332eada49ccb6ecd0a20f64b795/b1f03ee8f92e476d9395c416839d5315_a62e3eb9c6d243a3afd52b4e6b9f942345005c_mw.jpeg
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    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    131555


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or film in TEM. Capabilities: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images) Holders: Single-tilt holder Double-tilt holder Cryo-holder Tomography holder
    配置
    Specifications: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images)
    OEM 代工型號說明
    The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.
    文檔

    無文檔

    類似上架商品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEM年份: 0條件: 二手上次驗證:超過60天前
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEM年份: 0條件: 二手上次驗證:超過60天前
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEM年份: 2005條件: 二手上次驗證:超過60天前