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描述
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer配置
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEM 代工型號說明
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.文檔
無文檔
類別
Spectrometer / SIMS
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
63898
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KRATOS ANALYTICAL
AXIS ULTRA
類別
Spectrometer / SIMS
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
63898
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer配置
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEM 代工型號說明
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.文檔
無文檔