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IONTOF TOF.SIMS M6
    描述
    無描述
    配置
    -M6 High Performance Time‑of‑Flight Secondary Ion Mass Spectrometry System – Main unit of the M6 system. -Bake‑out Loadlock – In‑chamber baking system for the loadlock. -Nanoprobe 50 – Latest‑generation high‑performance BiMn cluster ion gun for high mass resolution surface spectroscopy, high lateral spatial resolution 2D/3D imaging, and high‑performance depth profiling. -DSC O₂/CS Dual Ion Source Optical Column – Electron‑bombardment gas ion source and thermal‑ionization Cs ion source; compatible with Nanoprobe 50 for depth profiling. -Auto Gas Flood System – Pressure‑controlled leak valve and nozzle for introducing trace gases onto the sample surface during analysis; automatic gas switching via Vacuum Control Unit (VCU). -Consumables – One‑year consumables package (slightly adjustable depending on configuration).
    OEM 代工型號說明
    未提供
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    已驗證

    類別
    Spectrometer / SIMS

    上次驗證: 2 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    149098


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    IONTOF TOF.SIMS M6

    IONTOF

    TOF.SIMS M6

    Spectrometer / SIMS
    年份: 0條件: 二手
    上次驗證2 天前

    IONTOF

    TOF.SIMS M6

    verified-listing-icon
    已驗證
    類別
    Spectrometer / SIMS
    上次驗證: 2 天前
    listing-photo-fd3d939ac59345b895842000268c599a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    149098


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    -M6 High Performance Time‑of‑Flight Secondary Ion Mass Spectrometry System – Main unit of the M6 system. -Bake‑out Loadlock – In‑chamber baking system for the loadlock. -Nanoprobe 50 – Latest‑generation high‑performance BiMn cluster ion gun for high mass resolution surface spectroscopy, high lateral spatial resolution 2D/3D imaging, and high‑performance depth profiling. -DSC O₂/CS Dual Ion Source Optical Column – Electron‑bombardment gas ion source and thermal‑ionization Cs ion source; compatible with Nanoprobe 50 for depth profiling. -Auto Gas Flood System – Pressure‑controlled leak valve and nozzle for introducing trace gases onto the sample surface during analysis; automatic gas switching via Vacuum Control Unit (VCU). -Consumables – One‑year consumables package (slightly adjustable depending on configuration).
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    類似上架商品
    查看全部
    IONTOF TOF.SIMS M6

    IONTOF

    TOF.SIMS M6

    Spectrometer / SIMS年份: 0條件: 二手上次驗證:2 天前