描述
ANALYTICAL EQUIPMENT配置
Apreo C LoVac FESEM with electrostatic final lens Resolution: 15kV – 1.0nm 1kV – 1.3nm 1kV (decel) 1.0nm Low Vacuum: 15kV - 1.2nm 3kV – 1.8nm -System includes EDXOEM 代工型號說明
Scanning electron microscope for versatile, high performance materials imaging and analysis.文檔
無文檔
THERMOFISHER SCIENTIFIC
Apreo 2 C
已驗證
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
45182
晶圓尺寸:
未知
年份:
2018
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC
Apreo 2 C
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
45182
晶圓尺寸:
未知
年份:
2018
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
ANALYTICAL EQUIPMENT配置
Apreo C LoVac FESEM with electrostatic final lens Resolution: 15kV – 1.0nm 1kV – 1.3nm 1kV (decel) 1.0nm Low Vacuum: 15kV - 1.2nm 3kV – 1.8nm -System includes EDXOEM 代工型號說明
Scanning electron microscope for versatile, high performance materials imaging and analysis.文檔
無文檔