描述
JSM-6510LV配置
•JSM-6510LV •EDS AMETEK EDAX Octane Pro •Operation Keyboard •Motor Controlled Stage(2 Axis)OEM 代工型號說明
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.文檔
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JEOL
JSM-6510LV
已驗證
類別
SEM
上次驗證: 5 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
102053
晶圓尺寸:
未知
年份:
2014
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-6510LV
類別
SEM
上次驗證: 5 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
102053
晶圓尺寸:
未知
年份:
2014
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
JSM-6510LV配置
•JSM-6510LV •EDS AMETEK EDAX Octane Pro •Operation Keyboard •Motor Controlled Stage(2 Axis)OEM 代工型號說明
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.文檔
無文檔