描述
Scanning Electron Microscope (SEM)配置
無配置OEM 代工型號說明
Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.文檔
無文檔
JEOL
JSM-6490LV
已驗證
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
97745
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-6490LV
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
97745
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Scanning Electron Microscope (SEM)配置
無配置OEM 代工型號說明
Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.文檔
無文檔