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HITACHI SU-70
    描述
    ANALYTICAL EQUIPMENT
    配置
    Imaging: 1.0nm at 15kV WD 4mm 1.6nm at 1kV 1.5mm deceleration mode 2.5nm at 1kV 1.5nm standard mode Magnification: Low Mag mode: 25 – 2,000x High Mag mode: 100- 800,000x Electron Optics: ZrO/W Schottky emission Probe current >200nA at 30kV Specimen Stage: 5 Axis motorization, X: 110mm, Y: 110mm, Z: 1.5 – 40mm, T: -5 to +70, R: 360 deg 150 mm Load Lock
    OEM 代工型號說明
    Analytical UHR Schottky Emission Scanning Electron Microscope Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Schottky electron gun. It features not only ultra-high resolution (1.0nm/15kV, 1.6nm/Kv (*)) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging derived from Hitachi’s highly reputed Super ExB filter technology. The Schottky electron gun enables a wide variety of analytical capabilities due to its high probe current (100nA).
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    HITACHI

    SU-70

    verified-listing-icon

    已驗證

    類別
    SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    36388


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    HITACHI SU-70

    HITACHI

    SU-70

    SEM
    年份: 0條件: 翻新的
    上次驗證超過60天前

    HITACHI

    SU-70

    verified-listing-icon
    已驗證
    類別
    SEM
    上次驗證: 超過60天前
    listing-photo-bbb7d005085e4963a834569a845d73cd-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    36388


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    ANALYTICAL EQUIPMENT
    配置
    Imaging: 1.0nm at 15kV WD 4mm 1.6nm at 1kV 1.5mm deceleration mode 2.5nm at 1kV 1.5nm standard mode Magnification: Low Mag mode: 25 – 2,000x High Mag mode: 100- 800,000x Electron Optics: ZrO/W Schottky emission Probe current >200nA at 30kV Specimen Stage: 5 Axis motorization, X: 110mm, Y: 110mm, Z: 1.5 – 40mm, T: -5 to +70, R: 360 deg 150 mm Load Lock
    OEM 代工型號說明
    Analytical UHR Schottky Emission Scanning Electron Microscope Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Schottky electron gun. It features not only ultra-high resolution (1.0nm/15kV, 1.6nm/Kv (*)) but also reduced charge-up imaging, compositional-contrast imaging, and ultra-low voltage imaging derived from Hitachi’s highly reputed Super ExB filter technology. The Schottky electron gun enables a wide variety of analytical capabilities due to its high probe current (100nA).
    文檔

    無文檔

    類似上架商品
    查看全部
    HITACHI SU-70

    HITACHI

    SU-70

    SEM年份: 0條件: 翻新的上次驗證:超過60天前