描述
無描述配置
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM 代工型號說明
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HITACHI
S-5200
已驗證
類別
SEM
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
96224
晶圓尺寸:
未知
年份:
未知
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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S-5200
已驗證
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
96224
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM 代工型號說明
未提供文檔
無文檔