描述
ANALYTICAL EQUIPMENT配置
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM 代工型號說明
Field Emission Scanning Electron Microscope文檔
無文檔
HITACHI
S-4800 II
已驗證
類別
SEM
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
36384
晶圓尺寸:
8"/200mm
年份:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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HITACHI
S-4800 II
已驗證
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
36384
晶圓尺寸:
8"/200mm
年份:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
ANALYTICAL EQUIPMENT配置
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 axis motorized Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg. Operating System: Windows XP Professional Options: 1. Trackball for stage control 2. TE (STEM) detector 3. Video Amplifier unit 4. Photomultiplier Power Supply 5. Deceleration function 6. Electrostatic beam blanking unit 7. Quartz PCI 8. Chamber camera 9. RS-232C 10. Dry roughing pumpOEM 代工型號說明
Field Emission Scanning Electron Microscope文檔
無文檔