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HITACHI RS-4000
    描述
    MET
    配置
    無配置
    OEM 代工型號說明
    The RS-4000 performs at a high throughput of 1,200 DPH (defects per hour), which is about 3 times faster than the conventional model, and performs defect review at a high speed and high defect capture rate thereby improving image resolution (3 nm) and enhancing image processing. Combined with ADC (automatic defect classification) to identify killer defects, the tool produces data directly linked with yield enhancement in a short time. Furthermore, the newly added function of tilt image observation by tilting the electron beam enables the tool to generate more defect information.
    文檔

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    HITACHI

    RS-4000

    verified-listing-icon

    已驗證

    類別
    SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    75642


    晶圓尺寸:

    8"/200mm


    年份:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEM
    年份: 2005條件: 二手
    上次驗證超過60天前

    HITACHI

    RS-4000

    verified-listing-icon
    已驗證
    類別
    SEM
    上次驗證: 超過60天前
    listing-photo-ef30e62853474ddbb8f003527851ff6e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    75642


    晶圓尺寸:

    8"/200mm


    年份:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    MET
    配置
    無配置
    OEM 代工型號說明
    The RS-4000 performs at a high throughput of 1,200 DPH (defects per hour), which is about 3 times faster than the conventional model, and performs defect review at a high speed and high defect capture rate thereby improving image resolution (3 nm) and enhancing image processing. Combined with ADC (automatic defect classification) to identify killer defects, the tool produces data directly linked with yield enhancement in a short time. Furthermore, the newly added function of tilt image observation by tilting the electron beam enables the tool to generate more defect information.
    文檔

    無文檔

    類似上架商品
    查看全部
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEM年份: 2005條件: 二手上次驗證:超過60天前
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEM年份: 2003條件: 二手上次驗證:超過60天前
    HITACHI RS-4000

    HITACHI

    RS-4000

    SEM年份: 2003條件: 二手上次驗證:超過60天前