描述
Samples up to 9.5mm x 5mm x 2.4 mm (height)配置
High resolution, cold field emission SEM. 0.5 to 30 kV Magnification range of 30X to 800,000X Image resolutions of 0.6nm (at 30kV) and 3.5nm (at 1kV) are possible with secondary electron images.OEM 代工型號說明
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HITACHI
S-5000
已驗證
類別
SEM
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條件:
Used
作業狀態:
未知
產品編號:
55337
晶圓尺寸:
未知
年份:
未知
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S-5000
已驗證
類別
SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
55337
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Samples up to 9.5mm x 5mm x 2.4 mm (height)配置
High resolution, cold field emission SEM. 0.5 to 30 kV Magnification range of 30X to 800,000X Image resolutions of 0.6nm (at 30kV) and 3.5nm (at 1kV) are possible with secondary electron images.OEM 代工型號說明
未提供文檔
無文檔