描述
LEO Scanning Electron Microscope (Parts only)配置
無配置OEM 代工型號說明
SEM feature extra-large chambers for the non-destructive examination of large samples文檔
無文檔
LEO
1455
已驗證
類別
SEM / FIB
上次驗證: 7 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
116674
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
LEO
1455
類別
SEM / FIB
上次驗證: 7 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
116674
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
LEO Scanning Electron Microscope (Parts only)配置
無配置OEM 代工型號說明
SEM feature extra-large chambers for the non-destructive examination of large samples文檔
無文檔