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描述
LEO Scanning Electron Microscope (Parts only)配置
無配置OEM 代工型號說明
SEM feature extra-large chambers for the non-destructive examination of large samples文檔
無文檔
LEO
1455
類別
SEM / FIB
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
116674
晶圓尺寸:
6"/150mm
年份:
未知
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描述
LEO Scanning Electron Microscope (Parts only)配置
無配置OEM 代工型號說明
SEM feature extra-large chambers for the non-destructive examination of large samples文檔
無文檔