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NOVA NANOSEM 450

類別
SEM / FIB
概述

The NOVA NANOSEM 450 is a type of Scanning Electron Microscope (SEM) that uses a Schottky Field Emission source. It has the ability to operate at both high and low voltages, providing ultra-high resolution imaging. Additionally, it can operate in low-vacuum mode, allowing for high-resolution imaging of samples that may not be suitable for high-vacuum conditions. The instrument is equipped with advanced technologies such as a two-mode final lens, beam deceleration, and environmental SEM capabilities, making it a versatile tool for researchers and developers working with a wide range of nano-materials and devices. It can also be used for e-beam writing with the NPGS Nanopattern Generation System. The Nova NanoSEM 450 is known for its excellent imaging and analytical performance, and its user-friendly design allows for easy switching between different instrument conditions based on the needs of the user. Its strong performance in low vacuum mode makes it particularly useful for obtaining high-quality analytical data on non-conductive materials such as glass or ceramics.

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