
描述
Mask Inspection Microscope配置
Mask Inspection Microscope, Technical Instrument K2 CD2 Stages NikonOEM 代工型號說明
The KMS-400 Critical Dimension Measurement and Inspection System is a completely automated pattern recognition and measurement system. The combination of high-resolution capabilities, a confocal microscope with a shallow depth of focus, and pattern recognition routines allow for easy capture of optical images for measurement.文檔
無文檔
ZYGO
KMS400
類別
Reticle / Mask Inspection
上次驗證: 6 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
65049
晶圓尺寸:
未知
年份:
1997
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Mask Inspection Microscope配置
Mask Inspection Microscope, Technical Instrument K2 CD2 Stages NikonOEM 代工型號說明
The KMS-400 Critical Dimension Measurement and Inspection System is a completely automated pattern recognition and measurement system. The combination of high-resolution capabilities, a confocal microscope with a shallow depth of focus, and pattern recognition routines allow for easy capture of optical images for measurement.文檔
無文檔