MeRiT LE
概述
EUV repair results by ZEISS MeRiT LE High-end repair on a EUV photomask performed with a MeRiT® LE. Shown tiny extrusion repair reflects future technology nodes of 5nm node and beyond. Repair has been verified by using AIMS® EUV measurements.
活躍中的上架商品
0
服務
檢驗、保險、評估、物流
最熱門的上架商品
- 未找到產品