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KLA OmniMap RS200+
    描述
    -8inch (Open Cassette) -F Probe(27.9kΩ/sq, 279.4Ω/sq, 2.794Ω/sq) -Galil Motion Controller -I7 Computer -Dual Probe Arm: P1 / P2 -LP1: 200mm OCA+ -LP2: 200mm OCA+ -RS SW: 10.0.0.6
    配置
    -Measurement range: > 5 mΩ/sq. to < 5 MΩ/sq -Measurement repeatability, based on KLA-Tencor’s “Probe Qualification Test” @ 1” test diameter, using the appropriate probe head: < 0.2% (1σ) -Reproducibility: Representative metals (e.g. Cu, W, TiN) < 0.5% (1σ) -Edge exclusion: From the conductive film edge for the following the probe heads: 25 mil pitch -1 mm with “enhanced” probe position 25 mil pitch -3 mm with “standard” probe position 40 mil pitch -4 mm with “standard” probe position 62.5 mil pitch -5 mm with “standard” probe position -Temperature measurement accuracy: ± 0.5°C -Temperature measurement repeatability: ± 0.2°C -Throughput: based on 5-site test with wafer alignment, fixed current and temperature compensation. 200 mm Single SMIF: ≥ 110 WPH -Measurement Capabilities Routine check: 1-30 sites programmable (ASTM standard tests included) XY maps and flexible, user-defined patterns: up to 1,200 sites programmable -Analysis Capabilities Contour/3-D map: 49, 81, 121, 225, 361, 441, 625 sites Diameter scan: 49, 81, 121, 225, 361, 441, 625 sites Probe qualification test: 20 sites Trend charts Recipe editing and data extraction capability Average, difference and ratio maps Temperature coefficient of resistance correction
    OEM 代工型號說明
    Sheet Resistance Measurement Systems The OmniMap® RS-200 resistivity mapping system, based on proven industry resistivity mapping standards, provides accurate and reliable sheet resistance measurement for 45nm and beyond. This resistivity mapping system provides capabilities such as advanced automation and improved edge performance to meet today's 300mm wafer production requirements.
    文檔

    KLA

    OmniMap RS200+

    verified-listing-icon

    已驗證

    類別
    Resistivity / Four Point Probe

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Installed / Running


    產品編號:

    111610


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA OmniMap RS200+

    KLA

    OmniMap RS200+

    Resistivity / Four Point Probe
    年份: 0條件: 二手
    上次驗證超過30天前

    KLA

    OmniMap RS200+

    verified-listing-icon
    已驗證
    類別
    Resistivity / Four Point Probe
    上次驗證: 超過30天前
    listing-photo-070ea67b8915473f89d973e2fd131336-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/50345/070ea67b8915473f89d973e2fd131336/e2da67bb493243119b72cafdb5172dcc_f6a34097bcf74b13b2b9c7eae4f77f9445005c_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Installed / Running


    產品編號:

    111610


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    -8inch (Open Cassette) -F Probe(27.9kΩ/sq, 279.4Ω/sq, 2.794Ω/sq) -Galil Motion Controller -I7 Computer -Dual Probe Arm: P1 / P2 -LP1: 200mm OCA+ -LP2: 200mm OCA+ -RS SW: 10.0.0.6
    配置
    -Measurement range: > 5 mΩ/sq. to < 5 MΩ/sq -Measurement repeatability, based on KLA-Tencor’s “Probe Qualification Test” @ 1” test diameter, using the appropriate probe head: < 0.2% (1σ) -Reproducibility: Representative metals (e.g. Cu, W, TiN) < 0.5% (1σ) -Edge exclusion: From the conductive film edge for the following the probe heads: 25 mil pitch -1 mm with “enhanced” probe position 25 mil pitch -3 mm with “standard” probe position 40 mil pitch -4 mm with “standard” probe position 62.5 mil pitch -5 mm with “standard” probe position -Temperature measurement accuracy: ± 0.5°C -Temperature measurement repeatability: ± 0.2°C -Throughput: based on 5-site test with wafer alignment, fixed current and temperature compensation. 200 mm Single SMIF: ≥ 110 WPH -Measurement Capabilities Routine check: 1-30 sites programmable (ASTM standard tests included) XY maps and flexible, user-defined patterns: up to 1,200 sites programmable -Analysis Capabilities Contour/3-D map: 49, 81, 121, 225, 361, 441, 625 sites Diameter scan: 49, 81, 121, 225, 361, 441, 625 sites Probe qualification test: 20 sites Trend charts Recipe editing and data extraction capability Average, difference and ratio maps Temperature coefficient of resistance correction
    OEM 代工型號說明
    Sheet Resistance Measurement Systems The OmniMap® RS-200 resistivity mapping system, based on proven industry resistivity mapping standards, provides accurate and reliable sheet resistance measurement for 45nm and beyond. This resistivity mapping system provides capabilities such as advanced automation and improved edge performance to meet today's 300mm wafer production requirements.
    文檔
    類似上架商品
    查看全部
    KLA OmniMap RS200+

    KLA

    OmniMap RS200+

    Resistivity / Four Point Probe年份: 0條件: 二手上次驗證:超過30天前