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VEECO DEKTAK 3030
  • VEECO DEKTAK 3030
  • VEECO DEKTAK 3030
  • VEECO DEKTAK 3030
描述
DEKTAT VECO 3030 PROFILOMETER
配置
DEKTAT VECO 3030 PROFILOMETER
OEM 代工型號說明
The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.
文檔

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類別
Profiler

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

103521


晶圓尺寸:

未知


年份:

1988


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

VEECO

DEKTAK 3030

verified-listing-icon
已驗證
類別
Profiler
上次驗證: 超過60天前
listing-photo-ffb6c52aac644adcad55812c446eed8f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

103521


晶圓尺寸:

未知


年份:

1988


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
DEKTAT VECO 3030 PROFILOMETER
配置
DEKTAT VECO 3030 PROFILOMETER
OEM 代工型號說明
The Veeco DEKTAK 3030 is a surface profile measuring system designed for measuring the surface profiles of surfaces such as wafers and microelectronic devices. It is capable of measuring surface profiles with a resolution of 0.1 nanometers and a vertical accuracy of 0.25 nanometers. It is also capable of measuring high aspect ratios and precision features. The system uses a stylus-based probe to measure the surface profile, with a stylus force of 0.5 to 5.0 milliNewtons. The system can also be used for measuring surface flatness, surface roughness, and other surface parameters.
文檔

無文檔