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SENSOFAR PLu NEOX
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
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    SENSOFAR

    PLu NEOX

    verified-listing-icon

    已驗證

    類別
    Profiler

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    77624


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Profiler
    年份: 2011條件: 二手
    上次驗證超過60天前

    SENSOFAR

    PLu NEOX

    verified-listing-icon
    已驗證
    類別
    Profiler
    上次驗證: 超過60天前
    listing-photo-5c9985c03af146d9a81d6a84ba2b210a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    77624


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
    文檔

    無文檔

    類似上架商品
    查看全部
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Profiler年份: 2011條件: 二手上次驗證:超過60天前
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Profiler年份: 0條件: 二手上次驗證:超過60天前