描述
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: Included配置
無配置OEM 代工型號說明
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.文檔
無文檔
KLA
P-6
類別
Profiler
上次驗證: 2 天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
140006
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
- Measurement Type: Stylus surface profiling (2D scan) - XY Stage: Manual stage, supports up to 150 mm wafers - OS: Windows XP - KLA OS: Profiler V7.35 - Microhead SR - Software: Profiler Application pre-installed on PC - Optics: Video camera with zoom/focus - Monitor, Windows PC, Keyboard & Mouse: Included配置
無配置OEM 代工型號說明
In July 2008, KLA launched the P-6 system which provides stylus profiling and analysis of surface topography, for issues such as roughness, film stress and curvature, in an economical benchtop design for samples up to 150mm.文檔
無文檔