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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA P-11
    描述
    Step Height Measurement System
    配置
    無配置
    OEM 代工型號說明
    Tencor P-11 is a surface profiling tool designed for R&D applications. It can analyze surface topography over a 205 mm scan length on various surfaces, including semiconductor wafers and printed circuit boards. Its Open Frame configuration allows for measurement scans of large objects.
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    KLA

    P-11

    verified-listing-icon

    已驗證

    類別
    Profiler

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    115132


    晶圓尺寸:

    8"/200mm


    年份:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    KLA P-11

    KLA

    P-11

    Profiler
    年份: 0條件: 零件工具
    上次驗證超過60天前

    KLA

    P-11

    verified-listing-icon
    已驗證
    類別
    Profiler
    上次驗證: 超過30天前
    listing-photo-6e9b8ea8803b4bfea14335b98c607322-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/6e9b8ea8803b4bfea14335b98c607322/9283d606e6f841d8b1b2d8be32b40976_1_mw.png
    listing-photo-6e9b8ea8803b4bfea14335b98c607322-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/6e9b8ea8803b4bfea14335b98c607322/cc098fceeb34427a8b1914e0760beef6_2_mw.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    115132


    晶圓尺寸:

    8"/200mm


    年份:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Step Height Measurement System
    配置
    無配置
    OEM 代工型號說明
    Tencor P-11 is a surface profiling tool designed for R&D applications. It can analyze surface topography over a 205 mm scan length on various surfaces, including semiconductor wafers and printed circuit boards. Its Open Frame configuration allows for measurement scans of large objects.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA P-11

    KLA

    P-11

    Profiler年份: 0條件: 零件工具上次驗證:超過60天前
    KLA P-11

    KLA

    P-11

    Profiler年份: 1997條件: 二手上次驗證:超過30天前
    KLA P-11

    KLA

    P-11

    Profiler年份: 1997條件: 二手上次驗證:超過60天前