描述
無描述配置
- Max. Scan Length : 30 mm - Max. Data Points : 120,000 - Stylus Force : 0.03~10mg (programmable) - 2.5 um Stylus Tip Radius Standard - Color Camera with fixed zoom 100X - Sample Thickness : 20 mm max. - Sample Size : 140mm diameter max. - Sample Translation : Manual Stage, X,Y Stage - 360 degree Rotation Stage(Manual) - Vertical Range : 400um - Vertical Resolution : 1 Å - 5Å RepeatabilityOEM 代工型號說明
The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.文檔
無文檔
類別
Profiler
上次驗證: 3 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
155034
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
AMBIOS TECHNOLOGY, INC
XP-1
類別
Profiler
上次驗證: 3 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
155034
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
- Max. Scan Length : 30 mm - Max. Data Points : 120,000 - Stylus Force : 0.03~10mg (programmable) - 2.5 um Stylus Tip Radius Standard - Color Camera with fixed zoom 100X - Sample Thickness : 20 mm max. - Sample Size : 140mm diameter max. - Sample Translation : Manual Stage, X,Y Stage - 360 degree Rotation Stage(Manual) - Vertical Range : 400um - Vertical Resolution : 1 Å - 5Å RepeatabilityOEM 代工型號說明
The AMBIOS XP-I profilometer allows the analysis of surface roughness with nanometer depth resolution using an adjustable needle pressure force in the range of 0.05 to 10 mg.文檔
無文檔