描述
Has confirmed that the following parts are missing. 1) Electricity Power Pack 2) CCD Camera配置
Tool was configured for Hot temperature range function. X,Y Overall Accuracy:±2.0μm (Temp Stability ±1 X,Y Stage Accuracy:±1.0μm Z Axis Stroke(Applicable stroke):37mm Z Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50 to 150 Tool was used with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000). Notes: Tool has been de-installed by the OEM. Tool is currently located in an off-site warehouse.OEM 代工型號說明
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).文檔
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ACCRETECH / TSK
UF3000
已驗證
類別
Probers
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
17290
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ACCRETECH / TSK
UF3000
已驗證
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
17290
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Has confirmed that the following parts are missing. 1) Electricity Power Pack 2) CCD Camera配置
Tool was configured for Hot temperature range function. X,Y Overall Accuracy:±2.0μm (Temp Stability ±1 X,Y Stage Accuracy:±1.0μm Z Axis Stroke(Applicable stroke):37mm Z Axis Control Accuracy:±2μm Stage Durability:200kgf Hot chuck Temp. Range:50 to 150 Tool was used with a JEC P2000A tester. INCLUDING A HINGE UNIT (MHF4000). Notes: Tool has been de-installed by the OEM. Tool is currently located in an off-site warehouse.OEM 代工型號說明
The UF3000 is a fully automatic, ultra-high function probing machine developed by ACCRETECH / TSK to be the de facto standard model for the semiconductor testing process. It meets a wide range of customer requirements, including high-mix low-volume production for System LSI and mass production for memories. The machine has received high evaluation from major device manufacturers in terms of CoO (Cost of Ownership) and OEE (Overall Equipment Efficiency).文檔
無文檔