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ROYCE INSTRUMENTS DE-35
  • ROYCE INSTRUMENTS DE-35
描述
ROYCE A45/DE35 SEMI-AUTO DIE SORTER PICKS OFF UP TO 6″ WAFER AND AUTOMATICALLY LOADS WAFFLE PACKS MOTORIZED INPUT TABLE WITH MANUAL DIE SELECTION
配置
無配置
OEM 代工型號說明
The Royce Instruments DE-35 is a semi-automatic die pick and place system used in the semiconductor industry. It is available for up to 200mm dia wafers standard, 300mm wafers special order and has a throughput of 700 to 1200 UPH, application dependent. The DE-35 has quick change multi-needle eject heads and an output stage for waffle packs, Gel-Paks, film frames etc. Options include non-surface contact die picking, die inverter, die underside inspection and high magnification die facet (edge) inspection.
文檔

無文檔

類別
Pick and Place

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

63979


晶圓尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ROYCE INSTRUMENTS

DE-35

verified-listing-icon
已驗證
類別
Pick and Place
上次驗證: 超過60天前
listing-photo-01f3e8d8dee64125971166c763502055-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1116/01f3e8d8dee64125971166c763502055/2a589b1957c64ab4b528b5be497f3dbf_copyimg202010301506411_mw.jpeg
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

63979


晶圓尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
ROYCE A45/DE35 SEMI-AUTO DIE SORTER PICKS OFF UP TO 6″ WAFER AND AUTOMATICALLY LOADS WAFFLE PACKS MOTORIZED INPUT TABLE WITH MANUAL DIE SELECTION
配置
無配置
OEM 代工型號說明
The Royce Instruments DE-35 is a semi-automatic die pick and place system used in the semiconductor industry. It is available for up to 200mm dia wafers standard, 300mm wafers special order and has a throughput of 700 to 1200 UPH, application dependent. The DE-35 has quick change multi-needle eject heads and an output stage for waffle packs, Gel-Paks, film frames etc. Options include non-surface contact die picking, die inverter, die underside inspection and high magnification die facet (edge) inspection.
文檔

無文檔