We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 閱讀詳情
描述
無描述配置
無配置OEM 代工型號說明
The Ismeca NX32 is a versatile and scalable 32-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. This system offers multiple configurations to handle various types of devices: it can handle wafers in film-frame for input and/or output, commonly used for LEDs and wafer-level package (WLP) devices; tray and tube input and/or output, suitable for integrated circuits and discretes; and bowl feeding, tape and de-taping, alignment, laser marking, inspection, and test modules. The NX32 is capable of testing devices at both ambient and hot temperatures, providing flexibility for diverse testing requirements.文檔
無文檔
類別
Packaging
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
74446
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
COHU / ISMECA
NX32
類別
Packaging
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
74446
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The Ismeca NX32 is a versatile and scalable 32-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. This system offers multiple configurations to handle various types of devices: it can handle wafers in film-frame for input and/or output, commonly used for LEDs and wafer-level package (WLP) devices; tray and tube input and/or output, suitable for integrated circuits and discretes; and bowl feeding, tape and de-taping, alignment, laser marking, inspection, and test modules. The NX32 is capable of testing devices at both ambient and hot temperatures, providing flexibility for diverse testing requirements.文檔
無文檔