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描述
無描述配置
SW version Vision: NativeNet V1.1.4322 SW version Machine: NM0529 V1.7 Installed modules: linear feeder, table 2 pos with Mark camera detection, rotary 1 , 3D camera , rotary 2 , N-tube , taper module Maintenance records: Half yearly preventive maintenance, monthly cleaningOEM 代工型號說明
The Ismeca NX16 is a high-speed, 16-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. The system offers great flexibility, allowing for various feeding methods, such as bowl or tube feeding, and supports tape and bulk output modules. It comes with multiple processing options, including laser marking, inspection, and testing. The NX16 is capable of testing devices at both ambient and hot temperatures, making it suitable for a wide range of testing applications.文檔
無文檔
類別
Packaging
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
121239
晶圓尺寸:
未知
年份:
2013
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / ISMECA
NX16
類別
Packaging
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
121239
晶圓尺寸:
未知
年份:
2013
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
SW version Vision: NativeNet V1.1.4322 SW version Machine: NM0529 V1.7 Installed modules: linear feeder, table 2 pos with Mark camera detection, rotary 1 , 3D camera , rotary 2 , N-tube , taper module Maintenance records: Half yearly preventive maintenance, monthly cleaningOEM 代工型號說明
The Ismeca NX16 is a high-speed, 16-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. The system offers great flexibility, allowing for various feeding methods, such as bowl or tube feeding, and supports tape and bulk output modules. It comes with multiple processing options, including laser marking, inspection, and testing. The NX16 is capable of testing devices at both ambient and hot temperatures, making it suitable for a wide range of testing applications.文檔
無文檔