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KLA ARCHER AIM
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    文檔

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    KLA

    ARCHER AIM

    verified-listing-icon

    已驗證

    類別
    Overlay

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    49248


    晶圓尺寸:

    12"/300mm


    年份:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlay
    年份: 2004條件: 二手
    上次驗證超過60天前

    KLA

    ARCHER AIM

    verified-listing-icon
    已驗證
    類別
    Overlay
    上次驗證: 超過60天前
    listing-photo-43625f203abe414686d7b2005cb2411c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    49248


    晶圓尺寸:

    12"/300mm


    年份:

    2003


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlay年份: 2004條件: 二手上次驗證:超過60天前
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlay年份: 0條件: 二手上次驗證:超過60天前
    KLA ARCHER AIM

    KLA

    ARCHER AIM

    Overlay年份: 2003條件: 二手上次驗證:超過60天前