KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

The Archer 500 is a high-performance overlay metrology system for advanced patterning processes. It offers improved precision, measurement speed, and meets strict specifications for overlay error on multi-patterning lithography layers. The Archer 500 utilizes an innovative multi-layer target to provide precise, fast feedback on overlay error. Improvements to the optical subsystems and platform result in better overlay measurement specifications than the previous-generation Archer 300. New illumination options enable overlay measurement capability on a wide range of lithography layers. The Archer 500 is suitable for multi-patterning technologies, in-line monitoring, and scanner qualification. It seamlessly integrates with K-T Analyzer and Recipe Database Manager to improve fab productivity.

KLA

ARCHER 500

Overlay

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ARCHER 500

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ARCHER 500

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KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

ARCHER 500

Overlay

類似上架商品

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500

KLA

ARCHER 500