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ASML YieldStar 1375F
    描述
    Overlay Measurement System
    配置
    無配置
    OEM 代工型號說明
    The YieldStar 1375F delivers nanometer-level overlay and CD measurements based on diffraction from chip structures themselves or small targets placed within the chip design.
    文檔

    無文檔

    ASML

    YieldStar 1375F

    verified-listing-icon

    已驗證

    類別
    Overlay

    上次驗證: 18 天前

    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    147631

    晶圓尺寸:

    12"/300mm

    年份:

    未知

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    ASML YieldStar 1375F

    ASML

    YieldStar 1375F

    Overlay
    年份: 0條件: 二手
    上次驗證18 天前

    ASML

    YieldStar 1375F

    verified-listing-icon
    已驗證
    類別
    Overlay
    上次驗證: 18 天前
    listing-photo-6da0f8db9b354f0aac2e0ff10bf2ced9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    147631

    晶圓尺寸:

    12"/300mm

    年份:

    未知

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Overlay Measurement System
    配置
    無配置
    OEM 代工型號說明
    The YieldStar 1375F delivers nanometer-level overlay and CD measurements based on diffraction from chip structures themselves or small targets placed within the chip design.
    文檔

    無文檔

    類似上架商品
    查看全部
    ASML YieldStar 1375F

    ASML

    YieldStar 1375F

    Overlay年份: 0條件: 二手上次驗證:18 天前