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MX61
概述
The Olympus MX61 is a 200 mm semiconductor inspection microscope that provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. It is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution.
活躍中的上架商品
9
服務
檢驗、保險、評估、物流
