OLYMPUS

SZ61

MX50A-F

The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changes

MX50

MX51-F	

The STM6 series is a range of measuring microscopes from Olympus that offers more versatility and higher performance than ever before. The series features a wide range of models to meet various customer demands for new measuring capabilities and superior functionality. Some of the models in the range include the STM6-LM, which is designed for fast inspection of large samples, and the high-precision STM6, which has the most compact body in its class. The series also offers many optional units to ensure that every measurement need can be met. Some of the outstanding features of the STM6 series include motorized focusing, advanced UIS2 optics, a high-rigidity body with integrated counters, high-performance long-life LED illumination for bright and clear images, and much more. Overall, the STM6 series is a highly advanced and versatile range of measuring microscopes that offers exceptional levels of precision and durability.

STM6

BX51

The Olympus MX61 is a 200 mm semiconductor inspection microscope that provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. It is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution.

MX61

The Olympus LEXT OLS3000 is a confocal laser scanning microscope that was launched on January 26, 2004. It has the world’s highest resolution of 0.12µm, achieved by using a newly developed optical system optimized for a 408nm semiconductor laser. The microscope also allows for color 3D observations by integrating an optical system used for optical microscopes into the laser system

LEXT OLS3000

The AL120-LMB86 is a bench-top semiconductor wafer inspection system designed to handle 6-inch and 8-inch wafers.

AL120-LMB86

"Semiconductor wafer inspection microscope (up to 200 mm) enabling
fast, accurate inspection via motorized aperture stop interlocked with
objective lens. Ergonomic design delivers operator comfort. SEMI S2/S8
compliance ensures safety and reliability."

MX61-F

The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.

MX61L

MX63

BX51M

AHMT3

SZ40

MX51

INSPB01

BH2-UMA

BHMJL

ESD-safe bonder arm and microscope carrier designed for stereo microscopes

SZ2-STB2

BX40

SZ51

AL110 + MX61

SZ60

SZ3060

MX61L-F

OLS4000

BX41M-LED

SZ61TR

BH3-MJL

BX53M

STM6-F10-3	

AL2100

SZ30

OLS31-SU

STM6-F21-3

BX51RF

OLS5000

IX70

MX80F

AL2000

STM7

SZ4045

The Vanox was the flagship in the Olympus America microscope lineup during most of the 1970s.

VANOX

MX50L

MX-40

STM6-LM

AL-1MBL

U-AFA1M

BXFMA

The Olympus DSX510 is a high-resolution, upright motorized digital microscope designed for industrial inspection, quality control, and research and development laboratories.

DSX510

MX61A

With an LED illuminator equivalent to or better than a 100 W halogen lamp, the BX53 microscope delivers
outstanding brightness that's ideal for teaching and polarized light applications.

BX53

MX80

SZX10

BX60F5

SZH-ILLK

MX50L-RF

BH-2-MJLT

SZ60TR-60 

FV3000

KL 1500 LCD

BH3-MJLA2

The DSX1000 digital microscope combines ease of use with advanced features to streamline your inspection workflow.

DSX1000

AL120-LMB12-LP3/MX61L

IX51

MHL 525

BH3-MJL-A5

SC30

MX63F

AL110-LMB12-LP2/MX61L-F	

BX51TRF

BH3-MJL-A6

MX-50A 

CKX41SF

IX71

MX50L-TF

AL 3110F

MX63L

MHL 110

The LEXT OLS4100 3D measuring laser microscope uses laser scanning to perform non-contact 3D measurement of complex surface features on electronic devices and other samples. As with current Olympus models, the LEXT OLS4100 guarantees both repeatability*1 and accuracy*2, while also being capable of high-resolution observation and highly accurate measurement over a wider area. It also features easier operation, including a function for acquiring 3D images automatically with a single click, and an image acquisition speed that is approximately twice as fast as the existing Olympus models.

LEXT OLS4100

BX41RF-LED

The FV1000 confocal laser scanning biological microscope was released in 2004.
This model featured the world's first twin scan system. This system enabled time-resolved spectroscopy of living intercellular contents and also made it possible to analyze objects down to a 2 nm wavelength resolution. Image size was increased to 4096 x 4096-pixels.

FV1000

BX6OMF

CX31

BX41TF

IX73

Brightfield / Darkfield Reflected Light Metallurgical Microscope

BX60M

WLS 8000

IX70-S8F2

The UC50 is a 5 megapixel digital color camera ideal for high resolution imaging providing 14-bit a wide dynamic range and high sensitivity along with a variety of frame rates using pixel binning and partial readout modes.

CCD chip
The 2,576 x 1,932-pixel CCD chip used in the UC50 offers 14 bits per color channel and can be used for variable exposure times between 100 μs and 160 s. These features, along with the high sensitivity, color fidelity, and superior contrast make the UC50 a great universal high-resolution color camera.

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