OLYMPUS

SZ61

SZ40

The Olympus MX50 is a microscope designed for inspecting semiconductors and wafers. It is user-friendly and allows for comfortable operation during extended periods of use. The microscope offers a variety of observation methods, including brightfield, darkfield, differential interference contrast (DIC), and polarized light. Additionally, it has a motorized objective change feature for quick and easy observation changes

MX50

MX50A-F

The STM6 series is a range of measuring microscopes from Olympus that offers more versatility and higher performance than ever before. The series features a wide range of models to meet various customer demands for new measuring capabilities and superior functionality. Some of the models in the range include the STM6-LM, which is designed for fast inspection of large samples, and the high-precision STM6, which has the most compact body in its class. The series also offers many optional units to ensure that every measurement need can be met. Some of the outstanding features of the STM6 series include motorized focusing, advanced UIS2 optics, a high-rigidity body with integrated counters, high-performance long-life LED illumination for bright and clear images, and much more. Overall, the STM6 series is a highly advanced and versatile range of measuring microscopes that offers exceptional levels of precision and durability.

STM6

The Olympus MX61L is a microscope designed for inspecting semiconductors with a 300mm frame. It offers high-quality imaging through various observation techniques, including brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. This microscope is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution and is an extended frame version of the MX61 microscope, capable of handling 300mm wafers and flat panels up to 24x24 inches.

MX61L

BH2-UMA

The Olympus MX61 is a 200 mm semiconductor inspection microscope that provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence, infrared, and deep UV. It is part of the Olympus Semiconductor & Flat Panel Display Inspection Solution.

MX61

BX51

MX63

BX51M

The Olympus LEXT OLS3000 is a confocal laser scanning microscope that was launched on January 26, 2004. It has the world’s highest resolution of 0.12µm, achieved by using a newly developed optical system optimized for a 408nm semiconductor laser. The microscope also allows for color 3D observations by integrating an optical system used for optical microscopes into the laser system

LEXT OLS3000

SZ51

"Semiconductor wafer inspection microscope (up to 200 mm) enabling
fast, accurate inspection via motorized aperture stop interlocked with
objective lens. Ergonomic design delivers operator comfort. SEMI S2/S8
compliance ensures safety and reliability."

MX61-F

SZ30

MX51

BHMJL

SZ60

BX41M-LED

SZ3060

OLS31-SU

BX40

INSPB01

AL110 + MX61

MX61L-F

AL-1MBL

AL120-LMB12-LP3/MX61L

MX50T-F

BH3-MJLA2

MHL 525

MX80F

BH3-MJL

BX6OMF

IX70

SZ1145TR

IX71

AL110-LMB12/MX50LR

BX60F5

With an LED illuminator equivalent to or better than a 100 W halogen lamp, the BX53 microscope delivers
outstanding brightness that's ideal for teaching and polarized light applications.

BX53

BX61	

BX41RF-LED

SZH-ILLK

BXFMA

STM6-LM

AHMT3

CKX41SF

OLS5000

IX51

CK40

OLS4000

BX51TRF

SZ4045

MX-50A 

IX70-S8F2

AL110-LMB12-LP2/MX61L-F	

MX-40

U-AFA1M

AL2000

STB1	

SZ6045

AL3120F

OLS5100

MX50A-873MD

BH3-MJL-A5

AL3100

The LEXT OLS4100 3D measuring laser microscope uses laser scanning to perform non-contact 3D measurement of complex surface features on electronic devices and other samples. As with current Olympus models, the LEXT OLS4100 guarantees both repeatability*1 and accuracy*2, while also being capable of high-resolution observation and highly accurate measurement over a wider area. It also features easier operation, including a function for acquiring 3D images automatically with a single click, and an image acquisition speed that is approximately twice as fast as the existing Olympus models.

LEXT OLS4100

IX73

AL120-LMB12

BX41TF

The FV1000 confocal laser scanning biological microscope was released in 2004.
This model featured the world's first twin scan system. This system enabled time-resolved spectroscopy of living intercellular contents and also made it possible to analyze objects down to a 2 nm wavelength resolution. Image size was increased to 4096 x 4096-pixels.

FV1000

IX50

STM7

AL3120F-DUV-EL

MHL 110

STM7-MF

Brightfield / Darkfield Reflected Light Metallurgical Microscope

BX60M

AL3120

BX60

The UC50 is a 5 megapixel digital color camera ideal for high resolution imaging providing 14-bit a wide dynamic range and high sensitivity along with a variety of frame rates using pixel binning and partial readout modes.

CCD chip
The 2,576 x 1,932-pixel CCD chip used in the UC50 offers 14 bits per color channel and can be used for variable exposure times between 100 μs and 160 s. These features, along with the high sensitivity, color fidelity, and superior contrast make the UC50 a great universal high-resolution color camera.

UC50

AL3300

FV3000

AL3320

AL 3110F

MX50L-TF

The Vanox was the flagship in the Olympus America microscope lineup during most of the 1970s.

VANOX

GX53

SZH-ILLC-2

WLS 8000

MX40F

MX80 AF F

PME 3

BH2-MJL-73D

SZ61TR

100N-LM8

STM6-F21-3

The CKX41 is an inverted microscope suitable for regular cell observation including GFP and other fluorescence applications. The high-angle tilting head is ideal for simple visual checks, while advanced Universal Infinity System 2 (UIS2) optics produce outstanding images. Olympus relief contrast increases visibility with non-glass cell culture vessels and improves productivity with its pre-centered slider. Post-acquisition analysis, documentation, and archiving can be achieved with digital cameras and software.

CKX41

OLYMPUS

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