描述
metallographic microscope配置
1. Eyepiece: SWN 10X 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole manual nose wheel 4. Upper light source lamp house 5. Bright and dark vision body, objective lens: 5XBD , 10XBD , 20XBD , 50XBD 6. CCD adapter mirror 7. Mobile bed: 6X6 STAGEOEM 代工型號說明
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.文檔
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NIKON
OPTIPHOT 150
已驗證
類別
Microscope
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
74560
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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NIKON
OPTIPHOT 150
類別
Microscope
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
74560
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
metallographic microscope配置
1. Eyepiece: SWN 10X 2. Observation tube: three-eye observation tube 3. Nose wheel: 5-hole manual nose wheel 4. Upper light source lamp house 5. Bright and dark vision body, objective lens: 5XBD , 10XBD , 20XBD , 50XBD 6. CCD adapter mirror 7. Mobile bed: 6X6 STAGEOEM 代工型號說明
The OPTIPHOT 150 series is equipped with Nikon's CF Infinity Corrected Optical System, the new Universal Epi-illuminator 10 for pinhole illumination brightfield, darkfield, DIC (Differential Interference Contrast) and epi-fluorescence observations, and a rigid frame that was designed using CAE structural analysis. The OPTIPHOT 150 series offers superior high-magnification observation compared with conventional microscopes and enables inspection of highly integrated wafers.文檔
無文檔