描述
無描述配置
-Magnification: 20-10,000x -Accelerating Voltage: 15KV -Observation modes: Standard/charge up reduction mode Specimen traverse: X: 15mm, Y: 18mm -Maximum Sample Size: 70mm in diameter -Maximum Sample Thickness: 20mm -Electron Gun: Pre-centered cartridge filament -Detection system: High sensitive semiconductor BSE detector Auto functions: Auto Start, Auto focus, ---Auto brightness -Frame Memory: 640 x 480, 1280 x 960 pixels -Image Format: BMP -Evacuation system: Turbomolecular and diaphragm pumps Windows OS: XP -Power Source: Single phase AC 100, 110, 115, 200, 220 or 240VOEM 代工型號說明
The "TM-1000" allows for stereoscopically morphological observation with high resolution and a greater depth of focus which are not available with an optical microscope. The "TM-1000" uses backscattered electrons (BSE) for image observation.文檔
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HITACHI
TM-1000
已驗證
類別
Microscope
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
74437
晶圓尺寸:
未知
年份:
2006
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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TM-1000
已驗證
類別
Microscope
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
74437
晶圓尺寸:
未知
年份:
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
-Magnification: 20-10,000x -Accelerating Voltage: 15KV -Observation modes: Standard/charge up reduction mode Specimen traverse: X: 15mm, Y: 18mm -Maximum Sample Size: 70mm in diameter -Maximum Sample Thickness: 20mm -Electron Gun: Pre-centered cartridge filament -Detection system: High sensitive semiconductor BSE detector Auto functions: Auto Start, Auto focus, ---Auto brightness -Frame Memory: 640 x 480, 1280 x 960 pixels -Image Format: BMP -Evacuation system: Turbomolecular and diaphragm pumps Windows OS: XP -Power Source: Single phase AC 100, 110, 115, 200, 220 or 240VOEM 代工型號說明
The "TM-1000" allows for stereoscopically morphological observation with high resolution and a greater depth of focus which are not available with an optical microscope. The "TM-1000" uses backscattered electrons (BSE) for image observation.文檔
無文檔