描述
No missing parts配置
無配置OEM 代工型號說明
The PHEMOS-1000 is a high-res emission microscope for pinpointing semiconductor device failures by detecting weak light and heat emissions caused by defects. It seamlessly integrates with a general-purpose prober, leveraging familiar sample setups for versatile analysis. Optional laser scan system enables high-res pattern images. Multiple detectors cater to diverse analysis techniques. Different types of detectors are available for various analysis techniques such as emission analysis, thermal analysis, and IR-OBIRCH analysis. The PHEMOS-1000 supports a wide variety of tasks and applications ranging from prober socket boards to a large-size 300 mm wafer prober文檔
無文檔
類別
Microscope
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
106169
晶圓尺寸:
未知
年份:
1999
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HAMAMATSU
PHEMOS-1000
類別
Microscope
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
106169
晶圓尺寸:
未知
年份:
1999
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
No missing parts配置
無配置OEM 代工型號說明
The PHEMOS-1000 is a high-res emission microscope for pinpointing semiconductor device failures by detecting weak light and heat emissions caused by defects. It seamlessly integrates with a general-purpose prober, leveraging familiar sample setups for versatile analysis. Optional laser scan system enables high-res pattern images. Multiple detectors cater to diverse analysis techniques. Different types of detectors are available for various analysis techniques such as emission analysis, thermal analysis, and IR-OBIRCH analysis. The PHEMOS-1000 supports a wide variety of tasks and applications ranging from prober socket boards to a large-size 300 mm wafer prober文檔
無文檔