描述
SSM 2000 NANOSRP *. Fully refurbished. *. Can demonstrate any time.配置
Working System Measurement Performance - Spreading Resistance Dynamic Range : 1Ω to > 10Ω - Reistivity : 10-⁴~ 4x10⁴Ωcm - Concentration : E11 cm-3 ~ E21 cm-3 Computer Subsystem - Operating System : Window XP - Image Capture : Matrox Pulsar Frame Grabber / Video Controller - Application S/W : NanoSRP'" software Automated Features •; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing Subsystem with multiple sample fixture - Probe Spacing : Minimum 65 µ;m (Standard) - Probe Load : 10g (standard) - Sample Mounts : Up to 6 samples - Vision System : DIC / 5x, 10x, 20x, 50x objectives / Cohu 2100 series CCIR/RAL gray scale camera - Stage Motion : 80 mm X/Y/Z-axis range (80mm/90mm/3mm) - Vibration Damping Table Accessories - Mounted probes / Bevel Sample Mounts /Grinding jig / Heat sink for sample mounting /Mounting wax /0.05 or 0.1 um Diamond compound - Measurement fixture: 6 position - Conventional probe conditioning fixture : QTA/P probe qualification samples / Probe Shaper Tool / Probe Cleaner Tool / Gorey-Schneider probe grinderOEM 代工型號說明
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SSM
2000
已驗證
類別
Metrology
上次驗證: 23 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
66033
晶圓尺寸:
未知
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SSM
2000
類別
Metrology
上次驗證: 23 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
66033
晶圓尺寸:
未知
年份:
2004
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
SSM 2000 NANOSRP *. Fully refurbished. *. Can demonstrate any time.配置
Working System Measurement Performance - Spreading Resistance Dynamic Range : 1Ω to > 10Ω - Reistivity : 10-⁴~ 4x10⁴Ωcm - Concentration : E11 cm-3 ~ E21 cm-3 Computer Subsystem - Operating System : Window XP - Image Capture : Matrox Pulsar Frame Grabber / Video Controller - Application S/W : NanoSRP'" software Automated Features •; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing Subsystem with multiple sample fixture - Probe Spacing : Minimum 65 µ;m (Standard) - Probe Load : 10g (standard) - Sample Mounts : Up to 6 samples - Vision System : DIC / 5x, 10x, 20x, 50x objectives / Cohu 2100 series CCIR/RAL gray scale camera - Stage Motion : 80 mm X/Y/Z-axis range (80mm/90mm/3mm) - Vibration Damping Table Accessories - Mounted probes / Bevel Sample Mounts /Grinding jig / Heat sink for sample mounting /Mounting wax /0.05 or 0.1 um Diamond compound - Measurement fixture: 6 position - Conventional probe conditioning fixture : QTA/P probe qualification samples / Probe Shaper Tool / Probe Cleaner Tool / Gorey-Schneider probe grinderOEM 代工型號說明
未提供文檔
無文檔