跳到主要內容
Moov logo

Moov Icon
N & K 1700RT
    描述
    The n&k 1700-RT simultaneously determines thickness, n and k in the spectral range of 190-1000nm, and trench profile. These systems provide non-destructive, real time, high throughput measurements directly on the device and collect polarized reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point. These systems encompass advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system. This system includes a polarizer and special trench analysis software and provides non-destructive, real-time measurements of CD, trench depth, and profile.
    配置
    Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. Spotsize: R = 50um, T < 400um with manual loading. The n&k 1700-RT is designed for handling 5” or 6” square masks.
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    N & K

    1700RT

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    66004


    晶圓尺寸:

    未知


    年份:

    2005

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    N & K 1700RT

    N & K

    1700RT

    Metrology
    年份: 2005條件: 翻新的
    上次驗證超過30天前

    N & K

    1700RT

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 超過30天前
    listing-photo-4eb84b5d009d4379a7785ff270c46db3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4eb84b5d009d4379a7785ff270c46db3/a0119093019248f19ae8320e40496ceb_spk3510_mw.jpg
    listing-photo-4eb84b5d009d4379a7785ff270c46db3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4eb84b5d009d4379a7785ff270c46db3/1ba1893fa51644b28f411fda690235b2_2_mw.png
    listing-photo-4eb84b5d009d4379a7785ff270c46db3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4eb84b5d009d4379a7785ff270c46db3/fbf1ef159d61452e84db654d6bf251a0_3_mw.png
    listing-photo-4eb84b5d009d4379a7785ff270c46db3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4eb84b5d009d4379a7785ff270c46db3/ec74c05d890c4868878f4a9da3ded4fc_1_mw.png
    listing-photo-4eb84b5d009d4379a7785ff270c46db3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4eb84b5d009d4379a7785ff270c46db3/8dd0eb8b524545b9bdbda0f02f0aa3c7_4_mw.png
    listing-photo-4eb84b5d009d4379a7785ff270c46db3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4eb84b5d009d4379a7785ff270c46db3/35f4723566d444e384072e6d76270af3_spk3513_mw.jpg
    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    66004


    晶圓尺寸:

    未知


    年份:

    2005


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    The n&k 1700-RT simultaneously determines thickness, n and k in the spectral range of 190-1000nm, and trench profile. These systems provide non-destructive, real time, high throughput measurements directly on the device and collect polarized reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point. These systems encompass advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system. This system includes a polarizer and special trench analysis software and provides non-destructive, real-time measurements of CD, trench depth, and profile.
    配置
    Broadband spectrometry for film thickness and trench profile measurements on photomask reticles. Spotsize: R = 50um, T < 400um with manual loading. The n&k 1700-RT is designed for handling 5” or 6” square masks.
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    類似上架商品
    查看全部
    N & K 1700RT

    N & K

    1700RT

    Metrology年份: 2005條件: 翻新的上次驗證: 超過30天前