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描述
LEO/KOBELCO LTA-700 Wafer Lifetime Measure Variable Injection Type Wafer Lifetime Measuring System.配置
無配置OEM 代工型號說明
LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.文檔
無文檔
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
12654
晶圓尺寸:
6"/150mm
年份:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KOBELCO / LEO
LTA 700
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
12654
晶圓尺寸:
6"/150mm
年份:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
LEO/KOBELCO LTA-700 Wafer Lifetime Measure Variable Injection Type Wafer Lifetime Measuring System.配置
無配置OEM 代工型號說明
LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.文檔
無文檔