描述
Critical Dimension (CD) Measurement (non SEM)配置
無配置OEM 代工型號說明
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.文檔
無文檔
類別
Metrology
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
134971
晶圓尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
KLA
SpectraShape 9000
類別
Metrology
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
134971
晶圓尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Critical Dimension (CD) Measurement (non SEM)配置
無配置OEM 代工型號說明
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.文檔
無文檔