跳到主要內容
Moov logo

Moov Icon
KLA FLX 2320
    描述
    Stress Measurement TDCS
    配置
    Thin film stress measure
    OEM 代工型號說明
    The Tencor FLX-2320 is an equipment that accurately measures film stress at temperatures from -65°C to 500°C, using dual wavelength technology to work on all types of films, including transparent ones like silicon nitride. This helps better understand film properties in simulated process environments.
    文檔

    無文檔

    KLA

    FLX 2320

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Installed / Idle


    產品編號:

    93187


    晶圓尺寸:

    未知


    年份:

    2000

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA FLX 2320

    KLA

    FLX 2320

    Metrology
    年份: 1992條件: 二手
    上次驗證超過60天前

    KLA

    FLX 2320

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 超過30天前
    listing-photo-70bbb97f5d4e4212b001c5ce11597236-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/70bbb97f5d4e4212b001c5ce11597236/2339566eaad64bb2b46dcb30d4cb99cb_be5471a7adf2451c98b3faf25bffc5911201a_mw.jpeg
    listing-photo-70bbb97f5d4e4212b001c5ce11597236-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/70bbb97f5d4e4212b001c5ce11597236/68e04aabc2c84fb8acd38e369209c834_8c92b5ba79004de8acc731c4aedfa6bc1201a_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Installed / Idle


    產品編號:

    93187


    晶圓尺寸:

    未知


    年份:

    2000


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Stress Measurement TDCS
    配置
    Thin film stress measure
    OEM 代工型號說明
    The Tencor FLX-2320 is an equipment that accurately measures film stress at temperatures from -65°C to 500°C, using dual wavelength technology to work on all types of films, including transparent ones like silicon nitride. This helps better understand film properties in simulated process environments.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA FLX 2320

    KLA

    FLX 2320

    Metrology年份: 1992條件: 二手上次驗證: 超過60天前
    KLA FLX 2320

    KLA

    FLX 2320

    Metrology年份: 1993條件: 二手上次驗證: 10 天前